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Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testing
- Article reference
- OLEN_108742
- Journal
- Optics and Lasers in Engineering
- Corresponding author
- Younghyun Kim
- First author
- Daehong Kim
- Received at Editorial Office
- 14 Aug 2024
- Article revised
- 9 Nov 2024
- Article accepted for publication
- 1 Dec 2024
- DOI
- 10.1016/j.optlaseng.2024.108742
Last update: 6 Dec 2024
Bibliographic information
- Volume/Issue
- Will appear soon
- Full bibliographic details
- Will appear soon
- Final article available online
-
6 Dec 2024
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Status comment
- The final version of your article is published online.
Production events
| Date | Event | Help |
|---|---|---|
| 6 Dec 2024 | The Share Link has been sent to you | |
| 6 Dec 2024 | Final version of your article published online | |
| 5 Dec 2024 | Your proof corrections have been returned to Elsevier | |
| 5 Dec 2024 | Proofs available for checking | |
| 4 Dec 2024 | Rights & Access form completed by you | |
| 3 Dec 2024 | Rights & Access form sent to you for completion | |
| 3 Dec 2024 | Offprint order letter sent to you for completion | |
| 1 Dec 2024 | Received for production |